Figure 5From: DeStripe: frequency-based algorithm for removing stripe noises from AFM imagesSEM imaging on a sintered specimen of CeO 2 (cerium oxide) at a sintering temperature of 1400°C for 2 hours and 50 minutes. The image is composed of 512 × 512 pixels with each side measuring 70.55 μm; the intensity unit is 0.1 μm.Back to article page