Restraint generation parameter from the X-ray structure (S2) equal to TABLE 1 | |
---|---|
Confidence level | 99.90% |
Distances | |
Distance range bb | 0.18 nm – 1.00 nm |
Used atoms | N, C, O |
Distance range sc | 0.18 nm – 1.00 nm |
Used atoms | Cβ, Cγ, Cδ, Cε, Cζ |
Number | 2001 |
Angles | |
Selected angles | ψ, φ, χ1, χ2, χ21, χ22, χ3, χ31, χ32, χ4, χ5, χ6 |
Number | 263 |