Restraint generation parameter from the X-ray structure (S2) | |
---|---|
Confidence level | 99.00% |
Distances | |
Distance range | 0.18 nm – 1.00 nm |
Used atoms | N, C, Cα, Cβ, Cγ, Cδ, Cε, Cζ, O |
Number | 5248 |
Angles | |
Selected angles | ψ, φ, χ1, χ2, χ21, χ22, χ3, χ31, χ32, χ4, χ5, χ6 |
Number | 321 |